SNE-3200M Tabletop SEM
Mid-Range Tabletop SEM (Scanning Electron Microscope)
A compact Tabletop SEM with 3-axis stage control and dual imaging detectors (SE/BSE) standard. Low vacuum capability for non-conductive samples is included. The SNE-3200 series Tabletop SEM matches or exceeds the imaging capabilities of all other tabletop SEM’s available with the exception of the SNE-4500M and SNE-4500M Plus. Additional features such as variable spot size control allow for the most flexible imaging as well as optimal x-ray generation for EDS analysis. The SNE-3200M comes standard with both Backscatter (BSE) and a true Everhart-Thornley Secondary Electron (SE) detector.
The SNE-3200M is a versatile microscope that can be easily used for Quality Control workflows, Engineering staff and even in Educational environments due to its robust design and easy to learn and use software.
Optionally, the SNE-3200M can be delivered with some features eliminated, making the SNE-3200M the most affordable SEM on the market.
Advanced options available:
EDS Elemental Analysis – Cooling Stage – Anti-Vibration table
15nm
Resolution
60,000x
Magnification (Live)
SE / BSE
Multi Detectors
1 – 30 kV
Beam Energy
SE (Secondary Electron) Imaging

Capture images with surface and topographic details
BSE (Back-Scattered Electron) Imaging

Capture images with material composition information (Atomic Weight Contrast imaging)
Stage System
X,Y,R (3-axis) – standard
X,Y,T (3-axis) – optional
Beam Shift:150μm
Auto Setting
Start (Filament Saturation)
Focus / Stigmator
Brightness / Contrast
Viewing Modes
Secondary Electron (SE)
Backscatter Electron (BSE)
Dual View SE/BSE Multi Display
Convenient specimen postioning is achieved via movement of the manual 3-axis stage. A wide variety of sample holders are available to accommodate any type of sample. The software offers the novice user a simple and clean interface free of clutter while the more advanced user can easily access features allowing further control of the microscope functions.
With the intuitive software, users are able to view and save either SE and BSE images or as a composite image combining both SE+BSE as shown below. This composite image provides a great tool for investigative analysis by offering both topographical (SE) and composition (BSE) information in one single image.

In addition, the software allows viewing both SE and BSE images in a side-by-side or Dual View mode.
Visit the SEM software page for VIDEO demonstrations and further details on software functionality.

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ELECTRON BEAM SYSTEM | |
Resolution |
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Accelerating Voltage |
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Detector |
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Electron Gun |
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IMAGING FEATURES | |
Automatic Functions |
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Magnification (Live) |
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Magnification (Saved) |
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Image Capture Sizes |
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Image Formats |
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Image Annotation |
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STAGE SYSTEM | |
Stage Traverse |
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Maximum Sample Size |
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VACUUM SYSTEM | |
Vacuum Modes |
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Roughing Vacuum Pump |
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High Vacuum Pumps |
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DIMENSIONS | |
Main Unit |
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Controller Unit |
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