SNE-3200M Tabletop SEM

Mid-Range Tabletop SEM

A compact Tabletop SEM with 3-axis stage control and dual imaging detectors (SE/BSE) standard. Low vacuum capability for non-conductive samples is included. The SNE-3200 series Tabletop SEM matches or exceeds the imaging capabilities of all other tabletop SEM’s available with the exception of the SNE-4500M and SNE-4500M Plus. Additional features such as variable spot size control allow for the most flexible imaging as well as optimal x-ray generation for EDS analysis. The SNE-3200M comes standard with both Backscatter (BSE) and a true Everhart-Thornley Secondary Electron (SE) detector.

The SNE-3200M is a versatile microscope that can be easily used for Quality Control workflows, Engineering staff and even in Educational environments due to its robust design and easy to learn and use software.

Optionally, the SNE-3200M can be delivered with some features eliminated, making the SNE-3200M the most affordable SEM on the market.

Advanced options available:
EDS Elemental Analysis – Cooling Stage – Anti-Vibration table

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Imaging Performance

RESOLUTION

15NM

MAGNIFICATION (LIVE)

60,000x

MULTI DETECTORS

SE / BSE

BEAM ENERGY

1-30 kV

SE (Secondary Electron) Imaging

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Capture images with surface and topographic details

BSE (Back-Scattered Electron) Imaging

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Capture images with material composition information (Atomic Weight Contrast imaging)

Convenience and Ease of Use

STAGE SYSTEM

X,Y,R (3-axis) – standard

X,Y,T (3-axis) – optional

Beam Shift:15μm

AUTO SETTING

Start (Filament Saturation)

Focus / Stigmator

Brightness / Contrast

VIEWING MODES

Secondary Electron (SE)

Backscatter Electron (BSE)

Dual View SE/BSE Multi Display

Convenient specimen postioning is achieved via movement of the manual 3-axis stage. A wide variety of sample holders are available to accommodate any type of sample. The software offers the novice user a simple and clean interface free of clutter while the more advanced user can easily access features allowing further control of the microscope functions.

With the intuitive software, users are able to view and save either SE and BSE images or as a composite image combining both SE+BSE as shown below. This composite image provides a great tool for investigative analysis by offering both topographical (SE) and composition (BSE) information in one single image.

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In addition, the software allows viewing both SE and BSE images in a side-by-side or Dual View mode.

Specifications for SNE-3200M

ELECTRON BEAM SYSTEM
RESOLUTION15nm (30kv, SE Image)
20nm (30kv, BSE Image)
ACCELERATING VOLTAGE1~30kV (1/5/10/15/20/30)
DETECTORSecondary Electron Image(SE)
Backscattered Electron Image(BSE)
4 Quadrant BSE - full on/off control
ELECTRON GUNPre-centered Tungsten Filament Cartridge
IMAGING FEATURES
AUTOMATIC FUNCTIONSAuto Start
Auto Focus
Auto Stigmator
Auto Contrast & Brightness
MAGNIFICATION (LIVE)20X~60,000X
MAGNIFICATION (SAVED)> 500,000X (theoretical - see explanation in FAQ)
IMAGE CAPTURE SIZES5120 x 3840
2560 x 1920
1280 x 960
640 x 480
320 x 240
IMAGE FORMATSBMP, JPEG, PNG, TIFF
IMAGE ANNOTATION2-Point Length
Multi-Point Length
Angle Measurement
Diameter Measurement
Area Measurements
Arrow/Rectangle Marking
Text Annotations
VACUUM SYSTEM
VACUUM MODESHigh & Low Vacuum (Charge Reduction)
ROUGHING VACUUM PUMPRotary Vane Pump (standard)
HIGH VACUUM PUMPPfeiffer HiPace Turbo Molecular Pump
DIMENSIONS
MAIN UNIT390(W) x 380(D) x 560(H)mm, 83kg
CONTROLLER UNIT390(W) x 325(D) x 560(H)mm, 37kg
STAGE SYSTEM
AUTOMATIC FUNCTIONS3-axis System (X, Y, R - Manual)
X, Y-axis : ±35mm
R-axis : 360°
* Image Shift : ±150μm
* T-axis : 0 to 45˚ (Optional - replaces R-axis)
MAXIMUM SAMPLE SIZE70mm in Diameter x 30mm in Height