SNE-3200M Tabletop SEM

Mid-Range Tabletop SEM (Scanning Electron Microscope)

A compact Tabletop SEM with 3-axis stage control and dual imaging detectors (SE/BSE) standard. Low vacuum capability for non-conductive samples is included.  The SNE-3200 series Tabletop SEM matches or exceeds the imaging capabilities of all other tabletop SEM’s available with the exception of the SNE-4500M and SNE-4500M Plus.  Additional features such as variable spot size control allow for the most flexible imaging as well as optimal x-ray generation for EDS analysis.  The SNE-3200M comes standard with both Backscatter (BSE) and a true Everhart-Thornley Secondary Electron (SE) detector.

The SNE-3200M is a versatile microscope that can be easily used for Quality Control workflows, Engineering staff and even in Educational environments due to its robust design and easy to learn and use software.

Optionally, the SNE-3200M can be delivered with some features eliminated, making the SNE-3200M the most affordable SEM on the market.

Advanced options available:
EDS Elemental Analysis – Cooling Stage – Anti-Vibration table


Imaging Performance




Magnification (Live)


Multi Detectors

1 – 30 kV

Beam Energy

SE (Secondary Electron) Imaging

Secondary Electron image examples

Capture images with surface and topographic details

BSE (Back-Scattered Electron) Imaging

Backscatter Electron image examples

Capture images with material composition information (Atomic Weight Contrast imaging)


Convenience and Ease-of-Use

Stage System

X,Y,R (3-axis) – standard

X,Y,T (3-axis) – optional

Beam Shift:150μm

Auto Setting

Start (Filament Saturation)

Focus / Stigmator

Brightness / Contrast

Viewing Modes

Secondary Electron (SE)

Backscatter Electron (BSE)

Dual View SE/BSE Multi Display

Convenient specimen postioning is achieved via movement of the manual 3-axis stage.  A wide variety of sample holders are available to accommodate any type of sample.  The software offers the novice user a simple and clean interface free of clutter while the more advanced user can easily access features allowing further  control of the microscope functions.

With the intuitive software, users are able to view and save either SE and BSE images or as a composite image combining both SE+BSE as shown below.  This composite image provides a great tool for investigative analysis by offering both topographical (SE) and composition (BSE) information in one single image.

Secondary and Backscatter Electron image comparison

In addition, the software allows viewing both SE and BSE images in a side-by-side or Dual View mode.

SEM Software User Interface

Visit the SEM software page for VIDEO demonstrations and further details on software functionality.

Related Products

Bruker XFlash EDS X-ray Spectrometer

Bruker EDS for Tabletop SEM

Xflash® 630 EDS for Tabletop SEM with 30mm² SDD and Esprit Compact or full featured Quantax 200 software

Detail View >>>

MIPAR Image Analysis software

MIPAR Image Analysis

MIPAR Image Analysis software for detailed feature analysis statistics of Particles, Pores, Fibers, Cells and more

Detail View >>>

compact Sputter Coaters

Sputter Coaters

Sample Preparation for Non-Conductive specimens in Tabletop SEM and Full-Size Scanning Electron Microscopes

Detail View >>>

Visit the Product List Page for other available accessories

Anti-Vibration options

Sample Holders

Calibration Standards

Specifications for SNE-3200M

    15nm (30kV, SE Image)
    20nm (30kV, BSE Image)
Accelerating Voltage
    1~30kV (1/5/10/15/20/30)
    Secondary Electron Image(SE)
    Backscattered Electron Image(BSE)
    4 Quadrant BSE - full on/off control
Electron Gun
    Pre-centered Tungsten Filament Cartridge
Automatic Functions
    Auto Start, Auto Focus
    Auto Stigmator, Auto Contrast & Brightness
Magnification (Live)
Magnification (Saved)
    > 500,000X (theoretical - see explanation in FAQ)
Image Capture Sizes
    5120 x 3840
    2560 x 1920
    1280 x 960
    640 x 480
    320 x 240
Image Formats
Image Annotation
    2-point length
    multi-point length
    angle measurement
    diameter measurement
    area measurements
    arrow/rectangle marking
    text annotations
Stage Traverse
    3-axis System (X, Y, R - Manual)
    X, Y-axis : ±35mm
    R-axis : 360°
    * Image Shift : ±150μm
    * T-axis : 0 to 45˚ (Optional - replaces R-axis)
Maximum Sample Size
    70mm in Diameter x 30mm in Height
Vacuum Modes
    High & Low Vacuum (Charge Reduction)
Roughing Vacuum Pump
    Rotary Vane Pump (standard)
High Vacuum Pumps
    Pfeiffer HiPace Turbo Molecular Pump
Main Unit
    390(W) x 380(D) x 560(H)mm, 83kg
Controller Unit
    390(W) x 325(D) x 560(H)mm, 37kg