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What is the SNE-Alpha Desktop SEM?

The SNE-Alpha is a desktop scanning electron microscope (SEM) manufactured by SEC Co. Ltd. and distributed exclusively in the United States by NanoImages. It delivers research-grade imaging with 5nm resolution at 30kV in a compact benchtop form factor, making it ideal for labs that lack space for traditional floor-model SEMs. The SNE-Alpha features a 5-axis motorized stage, dual SE/BSE detectors, and reaches operating vacuum in just 90 seconds—50% faster than competitors.

Why researchers choose the SNE-Alpha

5nm
Resolution at 30kV
Best in class for desktop SEM
90s
Vacuum Time
50% faster than competitors
40%
Smaller Footprint
Fits on any lab bench
250K×
Max Magnification
From macro to nano scale
SNE-Alpha Desktop Scanning Electron Microscope

SNE-Alpha Desktop SEM

Floor-model performance. Benchtop convenience. The SNE-Alpha delivers research-grade imaging without requiring a dedicated microscopy suite.

  • 1-30kV accelerating voltage (1kV steps)
  • 5-axis motorized stage with <5μm accuracy
  • SE and BSE detectors included
  • High vacuum standard, low vacuum optional
  • Optional: EDS, Raman, EBSD, CL integration
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Built for your research

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Frequently Asked Questions

What is the resolution of the SNE-Alpha desktop SEM?

The SNE-Alpha achieves 5nm resolution at 30kV, which is best-in-class for desktop scanning electron microscopes. This allows researchers to image nanoscale structures with clarity comparable to larger floor-model SEMs.

How long does vacuum pump-down take?

The SNE-Alpha reaches operating vacuum in just 90 seconds—50% faster than comparable desktop SEMs. Vent time is only 15 seconds, enabling rapid sample changes.

Does the SNE-Alpha require sample coating?

Not always. The optional low vacuum mode allows imaging of non-conductive samples without coating. For optimal resolution on non-conductive samples, gold, platinum, or carbon coating is recommended using our MCM-100 sputter coater.

Can I add EDS for elemental analysis?

Yes. The SNE-Alpha integrates with the Bruker XFlash 630 EDS detector for elemental analysis, detecting elements from Boron (B) to Uranium (U). Additional options include Raman spectroscopy, EBSD, and cathodoluminescence.

How does the SNE-Alpha compare to Phenom?

Compared to Phenom desktop SEMs, the SNE-Alpha offers a larger sample chamber, broader accelerating voltage range (1-30kV), lower-cost tungsten filament operation, and more flexible sample mounting options at comparable resolution.

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