Applications for Tabletop SEM
Aerospace
- Wear Particle Analysis (ARP 598c, ASTM D7416, ASTM F311/F312, ISO 16232-8, ISO 4407)
- Metal Inclusion Analysis (Steel Cleanliness – ASTM E1245/E2142/E45)
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Biology
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Chemistry
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Energy
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Environmental
- Particles on Filters or Wipes (ASTM D6059, ASTM E2090, ISO 14966)
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Forensics
- Gun Shot Residue – GSR (ASTM E1588)
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
GeoSciences
- Mineral Phase Analysis, Mineral Liberation, Modal Mineralogy, Petrography
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Healthcare & Medical
- Particulate Contamination in Injections and Parenteral Infusions (USP 788)
- Particle Analysis for Cleanliness (ISO 16431/18413, IEST 1246D)
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Metallurgy
- Metal Inclusion Analysis (Steel Cleanliness – ASTM E1245/E2142/E45)
- Wear Particle Analysis (ARP 598c, ASTM D7416, ASTM F311/F312, ISO 16232-8, ISO 4407)
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Micro-Electronics
All of the microelectronic devices we enjoy and depend on today would not be possible were it not for electron microscopy systems such as SEM, FIB, e-Beam Lithography, TEM and more. The research and development of micro-electronics devices is highly dependent on all type of electron beam tools for inspection, fabrication, and testing of all types of devices.
Scanning Electron Microscopes are found in many types of Micro-Electronic research, development and quality control.
- Inspection of Vias or inter-connects in printed circuit boards
- Inspection of Chip and Wire Bonding
- Failure Analysis of all type of microelectronic devices
- Development of LED lighting Technology
- Cleanliness Testing for ISO 16431/18413 and IEST 1246D
- Quality Control in Hard Drive memory devices
- Battery development and failure analysis
The SNE-4500M Plus with its automated 5-axis stage is a great tool for basic failure analysis and inspection of microelectronic devices.
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Nano-Materials
As Electron Microscopy tools have advanced in capabilities, so to has the world of nanotechnology and new materials development. Practically no field of science has not seen advancements in knowledge as a result of nano-material developments. Nano-materials play important new roles in improving or altering a materials mechanical, electrical, thermal, optical, and magnetic properties.
Scanning Electron Microscopes are used for many types of work in Material Science research, development and quality control.
- Use of carbon nanotubes for material property alteration
- Graphene implementation in a variety of products
- Polymer science use of carbon nanotubes
- Nano-particle implementation in coatings and paints
The SNE-4500M Plus with its 5nm resolution and 150,000X magnification is a great tool for basic analytical imaging of materials utilizing nanoscience technology.
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Pharmaceutical
- Particulate Contamination in Injections and Parenteral Infusions (USP 788)
- General Particle Analysis for Cleanliness (ISO 16431/18413, IEST 1246D)
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Semiconductors
All of the microelectronic devices we enjoy and depend on today would not be possible were it not for electron microscopy systems such as SEM, FIB, e-Beam Lithography, TEM and more. The Semiconductor industry is replete with all type of electron beam tools for inspection, fabrication, and testing of integrated circuits and the products made using them.
Scanning Electron Microscopes are used for many types of work in Semiconductor research, development and quality control.
- Ball Grid Array (BGA) packaging inspection
- Inspection of Vias or Through Silicon inter-connects
- Inspection of Wire Bonding
- Failure Analysis of Integrated Circuits
- Development of Display Technology – LCD, LED, ISP
- Advancing Photo-Voltaic Device (PVD) technology
- Micro Electro-Mechanical Systems (MEMS)
The SNE-4500M Plus with its automated 5-axis stage is a great tool for basic failure analysis and inspection of semiconductor devices.
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Textiles & Fibers
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Transportation
- General Particle Analysis for Cleanliness (ISO 16431/18413, IEST 1246D)
- Wear Particle Analysis (ARP 598c, ASTM D7416, ASTM F311/F312, ISO 16232-8, ISO 4407)
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Other Cool Stuff
Example images from a variety of application areas are provided to demonstrate a small portion of Tabletop SEM capabilities. Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.
NOTE: Images are reduced in size for website display.
Contact Us to request a download link for full-size high resolution images
Our Blog
Electron Microscopy: TEM vs. SEM
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10 Points to Consider when Making Buying Decisions for Tabletop SEM
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