NanoImages, LLC is the North American distributor (USA and Canada) for SEC Co. Ltd. of Suwon, South Korea. We currently distribute the SEC Series of Tabletop SEM (Scanning Electron Microscopes). SEC Co. Ltd. also offers a wide range of Industrial X-ray Inspection Systems used for non-destructive 2D and 3D inspection, most commonly for semiconductor components and castings.
We are proud to offer this exceptional family of compact SEM which we and our customers feel have superior capabilities as compared to other Tabletop SEM systems on the market and that approach the capabilities of full-size systems. We invite you to make an in-depth comparison to come to the same conclusion.
As a company, we strive to help our customers find and implement the best possible solution for their valuable research and equipment funds. With our wide range of past experience with other SEM systems, we know where different systems excel and fall short allowing us to provide you with honest verifiable facts to help in your decision-making process.
When we first began working on the SEC Series of compact Scanning Electron Microscopes, we were pleasantly surprised to find a “real” SEM – one that didn’t compromise on capabilities to attain a lower price. Finally, a Tabletop SEM solution was available that can offer the advanced user many of the capabilities of full-sized systems costing much more while still offering all of the advantages of a compact design – cost, footprint, robustness, ease-of-use, low service requirements and more.
We look forward to helping you, our customer to evaluate and utilize this remarkable line of scanning electron microscopes in your research and quality control efforts. We hope that you will take the time to work with us and learn more about the microscope solutions we offer.
Established in 1991, SEC has been continuously developing the backbone of e-beam inspection equipment in South Korea. SEC competes on a global basis with continuous development of its technologies.
SEC is an inspection systems company developing & selling industrial X-ray inspection systems and SEM (Scanning Electron Microscopes). SEC has also developed and offers a linear accelerator and semiconductor packaging system for LCD driver IC.
In 2016, SEC reached two significant milestones:
- Over 500 SEM Systems sold worldwide
- Over 1000 X-ray Inspection Systems installed worldwide
Scanning Electron Microscopy (SEM) is used in various manners such as composition analysis and surface structure analysis through several imaging detectors after focusing and detecting secondary electron emitted from the sample by directing an electron beam onto the sample held within a vacuum chamber. SEM is the foundation technique of the MEMS (micro-electro-mechanical systems) industry and a tool used for the analysis and measurement of ultrafine nano structures having features as small as 1 nanometer.
SEC had invented Open Tube and FPD equipment for the first time in Korea for inspecting and analyzing internal defects of electronic components, die cast parts and semiconductor packaging.
SEC supplies AFT (Auto Focus Tracing), Auto Ball Void measuring, Wire Sweep calculating functions, Screen divide & merge, and Auto Teaching equipment. Also offered are Micro CT (X-eye MCT Series) and Power CT (X-eye PCT Series) to precisely inspect and analyze inner structures of samples in 3D (3 dimensions).
Semiconductor Packaging System
In regard to semiconductor package process, SEC systems are able to counter with fine pitch and CSP mounting by directly connecting CHIP PAD to BUMP unlike existing DIE BONDERS and is used in the CMOS and LDI markets.