All of the microelectronic devices we enjoy and depend on today would not be possible were it not for electron microscopy systems such as SEM, FIB, e-Beam Lithography, TEM and more.  The Semiconductor industry is replete with all type of electron beam tools for inspection, fabrication, and testing of integrated circuits and the products made using them.

Scanning Electron Microscopes are used for many types of work in Semiconductor research, development and quality control.

  • Ball Grid Array (BGA) packaging inspection
  • Inspection of Vias or Through Silicon inter-connects
  • Inspection of Wire Bonding
  • Failure Analysis of Integrated Circuits
  • Development of Display Technology – LCD, LED, ISP
  • Advancing Photo-Voltaic Device (PVD) technology
  • Micro Electro-Mechanical Systems (MEMS)

The SNE-4500M Plus with its automated 5-axis stage is a great tool for basic failure analysis and inspection of semiconductor devices.

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Semiconductor SEM Applications
Electronics SEM Applications
Nano Science SEM Applications
Chemistry SEM Applications
Energy SEM Applications
Metallurgical SEM Applications
Automotive and Transportation SEM Applications
Aerospace SEM Applications
GeoScience SEM Applications - Geology, Mineralogy, Petrology
Textiles and Fibers SEM Applications
Environmental and Ecology SEM Applications
SEM Applications - Other Cool Stuff
Biology Entomology General Life Science SEM Applications
Healthcare and Medical SEM Applications
Pharmaceutical SEM Applications
Forensic SEM Applications

Example images from a variety of application areas are provided to demonstrate a small portion of  Tabletop SEM capabilities.  Our technical staff is happy to advise you and demonstrate the suitability of SEM to address the needs of your analytical requirements and sample types.