EDS
Bruker XFlash® 630 EDS
Transforming Tabletop SEM Capabilities: The Power of EDS Integration
Why Add EDS to Your Tabletop SEM?
The integration of Energy Dispersive X-ray Spectroscopy (EDS) transforms your tabletop SEM into a comprehensive analytical powerhouse. With the Bruker XFlash® 630 EDS system and ESPRIT Compact software, users unlock unprecedented material characterization capabilities in a compact format.
Superior Design for Optimal Results
The SNE-Alpha's innovative conical pole piece design maximizes EDS detection capabilities:
- Optimized solid angle for superior signal collection
- Enhanced detection efficiency compared to traditional flat pole piece designs
- Improved accuracy in elemental analysis
Expanded Analytical Capabilities
Essential Features with ESPRIT Compact
- Real-time elemental identification
- Comprehensive composition analysis
- Multi-point mapping capabilities
- Layer thickness measurements
- Dynamic element distribution visualization
Advanced Applications with QUANTAX 200 Software
Materials Analysis
- Metal inclusion investigation (Steel Cleanliness Standards)
- ASTM E1245
- ASTM E2142
- ASTM E45
Geological Applications
- Detailed mineral phase analysis
- Mineral liberation studies
- Modal mineralogy examination
- Advanced petrography capabilities
Forensic Analysis
- Gun Shot Residue (GSR) investigation
- Compliant with ASTM E1588
- Particle characterization
- Evidence documentation
Quality Control
- Cleanliness testing (ISO 16431/18413, IEST 1246D)
- Wear particle examination
- ARP 598c
- ASTM D7416
- ASTM F311/F312
- ISO 16232-8
- ISO 4407
Environmental Monitoring
- Filter and wipe analysis
- ASTM D6059
- ASTM E2090
- ISO 14966
- Particulate contamination assessment
- USP 788 compliance for medical applications
Industry Applications
Manufacturing
- Quality assurance
- Failure analysis
- Material verification
- Contamination identification
Research and Development
- Material characterization
- Product development
- Process optimization
- Competitive analysis
Pharmaceutical
- Particulate analysis
- Contamination control
- Quality compliance
- Research support
Benefits of EDS Integration
Time Efficiency
- Rapid elemental analysis
- Quick contamination identification
- Streamlined quality control
- Fast material verification
Cost Effectiveness
- Reduced need for multiple instruments
- Lower sample preparation requirements
- Decreased analysis time
- Improved workflow efficiency
Enhanced Capabilities
- Comprehensive material characterization
- Multi-element mapping
- Quantitative analysis
- Standards-compliant testing
Why Choose the Bruker System?
- Industry-leading detection technology
- User-friendly software interface
- Comprehensive analytical capabilities
- Proven reliability and support
- Seamless integration with tabletop SEM
Adding EDS capabilities to your tabletop SEM creates a versatile analytical platform suitable for diverse applications across multiple industries. The combination of the SNE-Alpha's superior design and Bruker's advanced technology delivers professional-grade analysis in a compact, accessible format.
Hardware
Main Specifications of XFlash® 630 EDS H for Tabletop SEM
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High speed embedded type SDD Dectector (No LN2 required)
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Energy resolution: Less than 129 eV (at Mn Ka)
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Detector area: 30mm
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Element detection range: B(5) – Am(95)
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Maximum input count rate: > 150 kcps
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Software: Qualitative or Quantitative Analysis
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Analysis Modes: Point, Circle, Polygon, Line Scan, Mapping

Software
Point / Area Composition
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The software has easy to use features for Composition Analysis at Points, Rectangles, Circles and Polygons
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Fast and accurate qualitative or quantitative analysis with calibration capability is standard
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Enhanced Deconvolution capabilities greatly improve quantified results
Mapping
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Fast and high resolution mapping analysis with Bruker’s HyperMap
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Mapping provides the function of analyzing the distribution of elements
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Maps of individual element distribution can be broken out and saved separately
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Spectra for each pixel are saved in a database for later recall and manipulation of point or line scan analysis
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Various user settings for saving formats, colors, depth, filters, and more
Line Scan
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Draw ROI (region of interest) with a line and analyze elements along that line
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Easy to compare the elemental difference along ROI with line profile graph
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Very useful for cross-section thickness analysis of multi-layer samples including the mixing zone
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Various user settings for saving formats, colors, line scan width, filters and more
Reporting
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A variety of reporting formats are provided that can be edited as desired
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One-click saving of reports in Word or PDF
