EDS

Bruker XFlash® 630 EDS

Transforming Tabletop SEM Capabilities: The Power of EDS Integration

Why Add EDS to Your Tabletop SEM?

The integration of Energy Dispersive X-ray Spectroscopy (EDS) transforms your tabletop SEM into a comprehensive analytical powerhouse. With the Bruker XFlash® 630 EDS system and ESPRIT Compact software, users unlock unprecedented material characterization capabilities in a compact format.

Superior Design for Optimal Results

The SNE-Alpha's innovative conical pole piece design maximizes EDS detection capabilities:

  • Optimized solid angle for superior signal collection
  • Enhanced detection efficiency compared to traditional flat pole piece designs
  • Improved accuracy in elemental analysis

Expanded Analytical Capabilities

Essential Features with ESPRIT Compact

  • Real-time elemental identification
  • Comprehensive composition analysis
  • Multi-point mapping capabilities
  • Layer thickness measurements
  • Dynamic element distribution visualization

Advanced Applications with QUANTAX 200 Software

Materials Analysis

  • Metal inclusion investigation (Steel Cleanliness Standards)
    • ASTM E1245
    • ASTM E2142
    • ASTM E45

Geological Applications

  • Detailed mineral phase analysis
  • Mineral liberation studies
  • Modal mineralogy examination
  • Advanced petrography capabilities

Forensic Analysis

  • Gun Shot Residue (GSR) investigation
    • Compliant with ASTM E1588
  • Particle characterization
  • Evidence documentation

Quality Control

  • Cleanliness testing (ISO 16431/18413, IEST 1246D)
  • Wear particle examination
    • ARP 598c
    • ASTM D7416
    • ASTM F311/F312
    • ISO 16232-8
    • ISO 4407

Environmental Monitoring

  • Filter and wipe analysis
    • ASTM D6059
    • ASTM E2090
    • ISO 14966
  • Particulate contamination assessment
    • USP 788 compliance for medical applications

Industry Applications

Manufacturing

  • Quality assurance
  • Failure analysis
  • Material verification
  • Contamination identification

Research and Development

  • Material characterization
  • Product development
  • Process optimization
  • Competitive analysis

Pharmaceutical

  • Particulate analysis
  • Contamination control
  • Quality compliance
  • Research support

Benefits of EDS Integration

Time Efficiency

  • Rapid elemental analysis
  • Quick contamination identification
  • Streamlined quality control
  • Fast material verification

Cost Effectiveness

  • Reduced need for multiple instruments
  • Lower sample preparation requirements
  • Decreased analysis time
  • Improved workflow efficiency

Enhanced Capabilities

  • Comprehensive material characterization
  • Multi-element mapping
  • Quantitative analysis
  • Standards-compliant testing

Why Choose the Bruker System?

  • Industry-leading detection technology
  • User-friendly software interface
  • Comprehensive analytical capabilities
  • Proven reliability and support
  • Seamless integration with tabletop SEM

Adding EDS capabilities to your tabletop SEM creates a versatile analytical platform suitable for diverse applications across multiple industries. The combination of the SNE-Alpha's superior design and Bruker's advanced technology delivers professional-grade analysis in a compact, accessible format.

Hardware

Main Specifications of XFlash® 630 EDS H for Tabletop SEM

  1. High speed embedded type SDD Dectector (No LN2 required)

  2. Energy resolution: Less than 129 eV (at Mn Ka)

  3. Detector area: 30mm

  4. Element detection range: B(5) – Am(95)

  5. Maximum input count rate: > 150 kcps

  6. Software: Qualitative or Quantitative Analysis

  7. Analysis Modes: Point, Circle, Polygon, Line Scan, Mapping

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Software

Point / Area Composition

  • The software has easy to use features for Composition Analysis at Points, Rectangles, Circles and Polygons

  • Fast and accurate qualitative or quantitative analysis with calibration capability is standard

  • Enhanced Deconvolution capabilities greatly improve quantified results

Mapping

  • Fast and high resolution mapping analysis with Bruker’s HyperMap

  • Mapping provides the function of analyzing the distribution of elements

  • Maps of individual element distribution can be broken out and saved separately

  • Spectra for each pixel are saved in a database for later recall and manipulation of point or line scan analysis

  • Various user settings for saving formats, colors, depth, filters, and more

Line Scan

  • Draw ROI (region of interest) with a line and analyze elements along that line

  • Easy to compare the elemental difference along ROI with line profile graph

  • Very useful for cross-section thickness analysis of multi-layer samples including the mixing zone

  • Various user settings for saving formats, colors, line scan width, filters and more

Reporting

  • A variety of reporting formats are provided that can be edited as desired

  • One-click saving of reports in Word or PDF

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