EBSD and EDS-Bruker EDXS
EBSD
Key Applications of EBSD Technology Across Major Industries
Materials Science and Engineering Applications
In aerospace, EBSD has become essential for studying the crystal structure of critical parts, helping engineers analyze how crystals are arranged in high-temperature alloys and advanced aluminum materials. The automotive industry uses EBSD to examine how metals deform during manufacturing, helping optimize forming processes and understand why parts fail. In electronics, EBSD reveals how grain boundaries affect electrical performance and reliability. For 3D printing, EBSD helps examine how materials solidify and why printed parts may have different properties in different directions.
Advanced Metallurgical Applications
Metal engineers use EBSD to study how metals change shape during processing, including how crystals slip and twin when deformed. When metals recover after processing, EBSD tracks how small grains form and grow. The technique precisely shows how one crystal structure transforms into another during heat treatment. For welding quality, EBSD maps stress patterns and examines how heat affects the metal structure near welds. Quality control programs now regularly use EBSD to verify that metal structures meet performance standards.
Semiconductor Industry Implementation
In semiconductor manufacturing, EBSD identifies small defects including stacking faults and twin boundaries in silicon. Crystal mapping helps connect electronic performance to structural features in thin films. When devices fail, EBSD helps identify crystal-related breakdown mechanisms. Manufacturing processes improve through EBSD data that links structure, properties, and processing methods for advanced semiconductor materials.
Benefits of Desktop SEM-EBSD Integration
Better Accessibility
Combining EBSD with desktop scanning electron microscopes takes up much less space than traditional floor-standing systems. The cost is significantly lower, allowing more labs to use this technology. These systems are easier to operate with simplified controls and automatic setup features. Results come faster through streamlined data collection and analysis.
Advanced Analysis Capabilities
Modern EBSD-SEM systems produce detailed crystal maps showing features smaller than a micron. Automatic phase identification uses crystal databases along with composition data. Data processing happens in real-time for immediate results. Combined EBSD and EDS analysis provides complete characterization of complex materials with multiple phases. Precise boundary analysis includes special types of grain boundaries and their distribution.
Technical Improvements
Recent advances include better electron detection through improved screen and camera designs. Pattern capture is now ten times faster using new detector technology. Software now uses advanced pattern matching with automatic background correction. Controls are designed to be easy to use without sacrificing analysis power. Integration with lab data systems makes handling results and reports much easier.
Unlock High-Resolution Insights.
Bruker’s QUANTAX ED-XS is an advanced, fully integrated EDS & EBSD system designed to accelerate scientific progress by making powerful analytical techniques accessible to a broader community of SEM users. Whether in academic research or industry, QUANTAX ED-XS offers an affordable, reliable, and high-performance solution for entry-level users.
At the heart of this innovation is the e-Flash XS, the most reliable and cost-effective EBSD detector ever commercialized, ensuring high-quality pattern acquisition and seamless analysis.
Affordable
- Low initial investment and cost of ownership
- High-reliability hardware with Field Replaceable Units (FRU) for minimal downtime
- Flexible service contract options for added peace of mind
Powerful
- Full-featured ESPRIT software suite, ensuring robust analytical capabilities with future expansion options
- Integrated, easy-to-use EDS & EBSD system
- CMOS EBSD camera with binning capability, combining the best of CMOS and CCD technologies
Dependable
- Optimized lab resource usage—run routine analyses and reduce backlog on expensive FE-SEMs
- Fast training and practice for new users with fewer time constraints
- Verify sample preparation before full EBSD sessions on high-end SEMs
- Safer operation with quick, reliable support from local Bruker specialists
Reliable & Easy to Use
QUANTAX ED-XS provides qualitative and quantitative EDS and EBSD analysis under the powerful ESPRIT software suite. Its 30 mm² XFlash® Silicon Drift Detector (LN2-free cooling) balances high throughput with superior light element detection. Complementing this is the e-Flash XS, the world’s most reliable and user-friendly EBSD detector.
Designed for maximum reliability and pattern quality, the e-Flash XS features:
CMOS camera with 720 x 540 native resolution and binning modes (2x2 to 6x6)
High-performance optical system for maximum light transmission
User-replaceable phosphor screen
Ultra-fast acquisition speeds (up to 520 frames/second) even at moderate probe currents
USB 3.0 plug-and-play interface for seamless data transfer and power supply
Ease of Use – No Compromises
QUANTAX ED-XS is designed for intuitive operation, making it the ideal tool for entry-level users:
✔ No calibration required – ESPRIT automatically adjusts pattern center coordinates for varying working distances
✔ Automatic camera gain optimization – ensures optimal signal-to-noise ratio in pattern acquisition
✔ Auto crystal phase setup – sets reflectors for the best pattern indexing with no user intervention
✔ Automated data saving & EHT shutdown – user-defined settings optimize map acquisitions and extend filament lifetime
✔ Safe EBSD detector handling – unique design prevents accidental SEM stage interference
Get Started with QUANTAX ED-XS
Unlock the full potential of EDS & EBSD with Bruker’s QUANTAX ED-XS—an affordable, high-performance solution that’s as easy to use as it is powerful.
Contact us today to learn more!
Want to learn more about EDS? https://www.nanoimages.com/sem-technology-overview/eds-elemental-analysis/