Desktop SEM Systems
Research-grade imaging in a compact, benchtop form factor. Built by microscopists, for microscopists.
Scanning Electron Microscopes
SNE-Alpha
Our flagship desktop SEM delivers floor-model performance with benchtop convenience. Perfect for materials science, life sciences, and quality control.
Accessories & Add-ons
Bruker XFlash 630 EDS
Silicon drift detector for elemental analysis. Detects Boron to Uranium with quantitative accuracy.
EBSD
Electron backscatter diffraction for crystallographic analysis. Map grain orientation and phase identification.
Cathodoluminescence (CL)
Detect light emission from electron beam excitation. Reveals defects, impurities, and material properties.
Raman Spectroscopy
Correlative SEM-Raman for molecular identification. Chemical analysis at the nanoscale.
EBIC
Electron beam induced current imaging. Characterize semiconductor junctions and defects.
MCM-100 Sputter Coater
Gold, platinum, or carbon coating for non-conductive samples. Compact benchtop design.
Not sure which system is right for you?
Our applications team can help you choose the perfect configuration for your research needs.