Posts by AZO

Electron Backscatter Diffraction (EBSD) is a powerful technique used in conjunction with Scanning Electron Microscopy (SEM) to analyze the crystallographic structure of materials. This integration allows researchers to study grain structures, phase distributions, and strain patterns at the microscale, offering valuable insights for materials science, metallurgy, and geoscience applications. By combining EBSD with SEM, researchers…

Electron Beam Induced Current (EBIC) is a powerful analytical technique used to study electronic properties of materials, particularly semiconductors and photovoltaic devices. When integrated with Scanning Electron Microscopy (SEM), EBIC provides detailed insights into charge carrier behavior, defect structures, and junction performance. This combination enables researchers to correlate electrical activity with microstructural features, making it…

Cathodoluminescence (CL) spectroscopy is a powerful technique used to study the optical and electronic properties of materials by analyzing light emitted when a material is exposed to an electron beam. When integrated with Scanning Electron Microscopy (SEM), CL provides unique insights into a sample’s composition, crystallinity, and defect structures at the microscale. This hybrid approach…

Raman spectroscopy and Scanning Electron Microscopy (SEM) are two powerful analytical techniques that, when combined, provide an unprecedented level of material characterization. The integration of these methods allows researchers to simultaneously acquire high-resolution structural images and detailed molecular or chemical information, making it particularly valuable in materials science, nanotechnology, and semiconductor research. Fundamental Principles of…