EBSD and EDS-Bruker ED-XS
Crystallography meets chemistry.
Combine electron backscatter diffraction (EBSD) with energy dispersive spectroscopy (EDS) for comprehensive material characterization. Map crystal orientations, identify phases, and correlate with elemental composition—all in one analysis.
Capabilities
Crystal Orientation Mapping
Determine grain orientations, texture, and misorientation. Visualize with inverse pole figure (IPF) maps.
Phase Identification
Distinguish phases with similar chemistry using crystallographic data combined with EDS composition.
Grain Boundary Analysis
Characterize grain boundaries, twin boundaries, and special boundaries by misorientation angle.
Strain Analysis
Detect residual strain and deformation through pattern quality and local misorientation maps.
Applications
Materials Science
Metals, polymers, composites, failure analysis.
Life Sciences
Cells, tissues, biological structures.
Semiconductors
Wafer inspection, defect analysis, IC packaging.
Forensics
GSR analysis, trace evidence, fiber comparison.
Geosciences
Minerals, rocks, paleontology.
Nanomaterials
Nanoparticles, thin films, quantum dots.
Related Products
Resources
Advanced Materials Characterization
EBSD+EDS provides insights impossible with either technique alone.
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