Bruker XFlash® 630 EDS
Transform your SEM into a comprehensive analytical powerhouse.
The integration of Energy Dispersive X-ray Spectroscopy (EDS) transforms your tabletop SEM into a complete materials characterization system. The Bruker XFlash® 630 silicon drift detector delivers exceptional energy resolution and high throughput for fast, accurate elemental analysis from Boron to Uranium.
The XFlash 630 is part of Bruker’s XFlash 6 family of silicon drift detectors, featuring the industry’s best energy resolution and highest throughput. With a slim-line design that provides the largest possible solid angle per active area, the detector maximizes collection efficiency—especially important at low electron beam currents typical of desktop SEM operation.
Why Add EDS to Your SEM?
Elemental Identification
Identify unknown materials by their chemical composition. Essential for failure analysis, contamination studies, quality control, and material verification in any industry.
Quantitative Analysis
Get precise weight and atomic percentages with standardless P/B-ZAF quantification. Export publication-ready data for reports and research papers.
Element Mapping
Visualize element distribution across your sample with color-coded maps. See compositional variations, inclusions, and phase distributions at a glance.
Point & Line Analysis
Analyze specific points of interest or create composition profiles across interfaces, welds, coatings, and phase boundaries.
High-Speed Acquisition
Input count rates exceeding 1.5 million cps with throughput up to 600 kcps. Analyze more samples in less time while maintaining best energy resolution.
Peltier Cooled
Thermoelectric cooling eliminates the need for liquid nitrogen. Lower maintenance, no consumables, and always ready when you need it.
Technical Specifications
| Parameter | Specification |
|---|---|
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 30mm² |
| Energy Resolution | <129 eV at Mn Kα (standard), 121 eV (limited edition) |
| Resolution at C Kα | 38 eV (limited edition) |
| Resolution at F Kα | 47 eV (limited edition) |
| Element Range | Boron (B, Z=5) to Uranium (U, Z=92) |
| Input Count Rate | >1,500,000 cps |
| Max Throughput | 600,000 cps |
| Take-off Angle | 35 degrees |
| Optimal Working Distance | 10mm |
| Cooling | Peltier (thermoelectric) – no LN2 required |
| Software | ESPRIT Compact with QUANTAX |
| Analysis Modes | Point, Line, Area, Mapping, HyperMap |
| Quantification | Standardless P/B-ZAF |
| Data Formats | .spx (spectrum), .bcf (HyperMap), .rtm (element maps) |
ESPRIT Compact Software
Automatic Peak ID
Intelligent peak identification with automatic element suggestions. No prior knowledge required to get started.
Smart Quantification
Standardless quantification with automatic matrix correction. Get accurate results without calibration standards.
HyperMap
Full spectrum at every pixel for post-acquisition analysis. Re-analyze regions without re-acquiring data.
Report Generation
Create professional reports with spectra, maps, and quantification tables. Export to PDF, Word, or image formats.
Applications
Materials Science
Metals, polymers, composites, failure analysis.
Life Sciences
Cells, tissues, biological structures.
Semiconductors
Wafer inspection, defect analysis, IC packaging.
Forensics
GSR analysis, trace evidence, fiber comparison.
Geosciences
Minerals, rocks, paleontology.
Nanomaterials
Nanoparticles, thin films, quantum dots.
Related Products
Resources
Add Elemental Analysis to Your SEM
The XFlash 630 integrates seamlessly with new or existing SNE-Alpha systems.
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