The SNE-Alpha desktop SEM gives materials science labs 5nm resolution, EDS elemental mapping, and EBSD crystallographic analysis in a benchtop instrument that reaches full vacuum in 90 seconds — no dedicated room, no liquid nitrogen, no specialist operator required. Used at MIT, Sandia, Oak Ridge, and 200+ published studies.
(925) 297-5668Stop Waiting for Shared SEM Time. Own Your Own.
The SNE-Alpha desktop SEM delivers floor-model performance in a benchtop package — purpose-built for materials science labs.
- 5nm resolution at 30kV — image grain boundaries, fractures, and microstructures
- 90-second vacuum — analyze more samples per day
- Add EDS for elemental mapping — identify phases and compositions
- Fits on your lab bench — no dedicated room needed
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Built for Materials Characterization
Failure Analysis
Image fracture surfaces, identify crack origins, and characterize failure modes with high-resolution SE and BSE imaging.
Microstructural Analysis
Resolve grain boundaries, precipitates, and phase distributions. Add EBSD for crystal orientation mapping.
Compositional Mapping
Pair with Bruker XFlash EDS to map elemental distributions, identify inclusions, and verify material specifications.
Proof is in the Pixel
Send us your toughest samples. We’ll show you what the SNE-Alpha can do.
Request Your DemoOr call: (925) 297-5668