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SNE-4500M Tabletop SEM

High Resolution Tabletop SEM (Scanning Electron Microscope)

A full featured Tabletop SEM with 5-axis stage control for the ultimate in sample positioning. The SNE-4500M is the only tabletop SEM with a variable aperture providing similar resolution to full-size floor model systems.

The SNE-4500M goes beyond the performance of traditional tabletop SEM’s and is capable of similar functionality of lower end full-size SEM systems.  Having more features than any other Tabletop SEM offers– the SNE-4500M is simply the most advanced compact SEM in its price range.

Advanced options available:
EDS Elemental Analysis – Backscatter detector (BSE) – Cooling Stage – Anti-Vibration table


Imaging Performance




Magnification (Live)

SE (BSE option)

Multi Detectors

1 – 30 kV

Beam Energy

high magnification Secondary Electron images

SE (Secondary Electron) Imaging

Secondary Electron image examples

Capture images with surface and topographic details

BSE (Back-Scattered Electron) Imaging – optional

Backscatter Electron image examples

Capture images with material composition information (Atomic Weight Contrast imaging)


Convenience and Ease-of-Use

Stage System

X,Y,Z,R,T (5-axis) – manual

Beam Shift:150μm

Auto Setting

Start (Filament Saturation)

Focus / Stigmator

Brightness / Contrast

Viewing Modes

Secondary Electron (SE)

Backscatter Electron (BSE) – optional

Dual View SE/BSE Multi Display

Specimen positioning is achieved via movement of the manual 5-axis stage. No other tabletop SEM in this class offers this capability.  A wide variety of sample holders are available to accommodate any type of sample.  The software offers the novice user a simple and clean interface free of clutter while the more advanced user can easily access features allowing further control of the microscope functions. With the intuitive software, users are able to view and save either SE and BSE images or as a composite image combining both SE+BSE as shown below (with optional BSE detector installed).  This composite image provides a great tool for investigative analysis by offering both topographical (SE) and composition (BSE) information in one single image.

Secondary and Backscatter Electron image comparison

In addition, the software allows viewing both SE and BSE images in a side-by-side or Dual View mode.

SEM Software User Interface

Visit the SEM software page for VIDEO demonstrations and further details on software functionality.

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Visit the Product List Page for other available accessories

Anti-Vibration options

Sample Holders

Calibration Standards

Specifications for SNE-4500M

    5nm (30kV, SE Image)
    10nm (30kV, BSE Image)
Accelerating Voltage
    1~30kV (1/5/10/15/20/30)
    Variable - 30 / 50 / 50 / 100 micron
    Variable e-Beam Spot Size
    Secondary Electron Image(SE)
    Backscattered Electron Image(BSE) - optional
    4 Quadrant BSE - full on/off control
Electron Gun
    Pre-centered Tungsten Filament Cartridge
Automatic Functions
    Auto Start, Auto Focus
    Auto Stigmator, Auto Contrast & Brightness
Magnification (Live)
Magnification (Saved)
    > 500,000X (theoretical - see explanation in FAQ)
Image Capture Sizes
    5120 x 3840
    2560 x 1920
    1280 x 960
    640 x 480
    320 x 240
Image Formats
Image Annotation
    2-point length
    multi-point length
    angle measurement
    diameter measurement
    area measurements
    arrow/rectangle marking
    text annotations
Stage Traverse
    5-axis System (X, Y, R, Z, T - Manual)
    X, Y-axis : ±40mm
    R-axis : 360°
    Z-axis : 0~35mm
    Tilt-axis : 0~45°
    * Image Shift : ±150μm
Maximum Sample Size
    80mm in Diameter or XY
    35mm in Height
Vacuum Modes
    High Vacuum - standard
    Low Vacuum (Charge Reduction) - optional
Roughing Vacuum Pump
    Rotary Vane Pump (standard)
High Vacuum Pumps
    Pfeiffer HiPace Turbo Molecular Pump
Main Unit
    390(W) x 380(D) x 560(H)mm, 88kg
Controller Unit
    390(W) x 325(D) x 560(H)mm, 37kg