SNE-4500M Tabletop SEM
High Resolution Tabletop SEM (Scanning Electron Microscope)
A full featured Tabletop SEM with 5-axis stage control for the ultimate in sample positioning. The SNE-4500M is the only tabletop SEM with a variable aperture providing similar resolution to full-size floor model systems.
The SNE-4500M goes beyond the performance of traditional tabletop SEM’s and is capable of similar functionality of lower end full-size SEM systems. Having more features than any other Tabletop SEM offers– the SNE-4500M is simply the most advanced compact SEM in its price range.
Advanced options available:
EDS Elemental Analysis – Backscatter detector (BSE) – Cooling Stage – Anti-Vibration table
5nm
Resolution
100,000x
Magnification (Live)
SE (BSE option)
Multi Detectors
1 – 30 kV
Beam Energy

SE (Secondary Electron) Imaging

Capture images with surface and topographic details
BSE (Back-Scattered Electron) Imaging – optional

Capture images with material composition information (Atomic Weight Contrast imaging)
Stage System
X,Y,Z,R,T (5-axis) – manual
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Beam Shift:150μm
Auto Setting
Start (Filament Saturation)
Focus / Stigmator
Brightness / Contrast
Viewing Modes
Secondary Electron (SE)
Backscatter Electron (BSE) – optional
Dual View SE/BSE Multi Display
Specimen positioning is achieved via movement of the manual 5-axis stage. No other tabletop SEM in this class offers this capability. A wide variety of sample holders are available to accommodate any type of sample. The software offers the novice user a simple and clean interface free of clutter while the more advanced user can easily access features allowing further control of the microscope functions. With the intuitive software, users are able to view and save either SE and BSE images or as a composite image combining both SE+BSE as shown below (with optional BSE detector installed). This composite image provides a great tool for investigative analysis by offering both topographical (SE) and composition (BSE) information in one single image.

In addition, the software allows viewing both SE and BSE images in a side-by-side or Dual View mode.
Visit the SEM software page for VIDEO demonstrations and further details on software functionality.

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ELECTRON BEAM SYSTEM | |
Resolution |
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Accelerating Voltage |
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Apertures |
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Detector |
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Electron Gun |
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IMAGING FEATURES | |
Automatic Functions |
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Magnification (Live) |
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Magnification (Saved) |
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Image Capture Sizes |
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Image Formats |
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Image Annotation |
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STAGE SYSTEM | |
Stage Traverse |
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Maximum Sample Size |
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VACUUM SYSTEM | |
Vacuum Modes |
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Roughing Vacuum Pump |
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High Vacuum Pumps |
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DIMENSIONS | |
Main Unit |
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Controller Unit |
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