SNE-4500M Tabletop SEM

High Resolution Tabletop SEM

High Resolution Tabletop SEM (Scanning Electron Microscope)

A full featured Tabletop SEM with 5-axis stage control for the ultimate in sample positioning. The SNE-4500M is the only tabletop SEM with a variable aperture providing similar resolution to full-size floor model systems.

The SNE-4500M goes beyond the performance of traditional tabletop SEM’s and is capable of similar functionality of lower end full-size SEM systems.  Having more features than any other Tabletop SEM offers– the SNE-4500M is simply the most advanced compact SEM in its price range.

Advanced options available:
EDS Elemental Analysis – Backscatter detector (BSE) – Cooling Stage – Anti-Vibration table

SNE4500MPC_angled

Imaging Performance

RESOLUTION

5NM

MAGNIFICATION (LIVE)

100,000x

MULTI DETECTORS

SE (BSE option)

BEAM ENERGY

1-30 kV

4500-SE-images

Capture images with surface and topographic details

SE (Secondary Electron) Imaging

SE-image-triple

Capture images with surface and topographic details

BSE (Back-Scattered Electron) Imaging – optional

BSE-image-triple

Capture images with material composition information (Atomic Weight Contrast imaging)

Convenience and Ease of Use

STAGE SYSTEM

X,Y,Z,R,T (5-axis) – manual

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Beam Shift:150μm

AUTO SETTING

Start (Filament Saturation)

Focus / Stigmator

Brightness / Contrast

VIEWING MODES

Secondary Electron (SE)

Backscatter Electron (BSE) – optional

Dual View SE/BSE Multi Display

Specimen positioning is achieved via movement of the manual 5-axis stage. No other tabletop SEM in this class offers this capability. A wide variety of sample holders are available to accommodate any type of sample. The software offers the novice user a simple and clean interface free of clutter while the more advanced user can easily access features allowing further control of the microscope functions. With the intuitive software, users are able to view and save either SE and BSE images or as a composite image combining both SE+BSE as shown below (with optional BSE detector installed). This composite image provides a great tool for investigative analysis by offering both topographical (SE) and composition (BSE) information in one single image.

img17

In addition, the software allows viewing both SE and BSE images in a side-by-side or Dual View mode.

Specifications for SNE-4500M

ELECTRON BEAM SYSTEM
RESOLUTION5nm (30kv, SE Image)
10nm (30kv, BSE Image)
ACCELERATING VOLTAGE1~30kV (1/5/10/15/20/30)
APERTURESVariable - 30 / 50 / 50 / 100 micron
Variable e-Beam Spot Size
DETECTORSecondary Electron Image(SE)
Backscattered Electron Image(BSE) - optional
4 Quadrant BSE - full on/off control
ELECTRON GUNPre-centered Tungsten Filament Cartridge
IMAGING FEATURES
AUTOMATIC FUNCTIONSAuto Start
Auto Focus
Auto Stigmator
Auto Contrast & Brightness
MAGNIFICATION (LIVE)20X~100,000X
MAGNIFICATION (SAVED)> 500,000X (theoretical - see explanation in FAQ)
IMAGE CAPTURE SIZES5120 x 3840
2560 x 1920
1280 x 960
640 x 480
320 x 240
IMAGE FORMATSBMP, JPEG, PNG, TIFF
IMAGE ANNOTATION2-Point Length
Multi-Point Length
Angle Measurement
Diameter Measurement
Area Measurements
Arrow/Rectangle Marking
Text Annotations
VACUUM SYSTEM
VACUUM MODESHigh & Low Vacuum - standard
Low Vacuum (Charge Reduction) - optional
ROUGHING VACUUM PUMPRotary Vane Pump (standard)
HIGH VACUUM PUMPPfeiffer HiPace Turbo Molecular Pump
DIMENSIONS
MAIN UNIT390(W) x 380(D) x 560(H)mm, 88kg
CONTROLLER UNIT390(W) x 325(D) x 560(H)mm, 37kg
STAGE SYSTEM
AUTOMATIC FUNCTIONS5-axis System (X, Y, R - Manual)
X, Y-axis : ±40mm
R-axis : 360°
Z-axis : 0~35mm
T-axis : 0~45˚
* Image Shift : ±150μm
MAXIMUM SAMPLE SIZE80mm in Diameter or XY
35mm in Height