SNE-4500M Tabletop SEM
High Resolution Tabletop SEM
High Resolution Tabletop SEM (Scanning Electron Microscope)
A full featured Tabletop SEM with 5-axis stage control for the ultimate in sample positioning. The SNE-4500M is the only tabletop SEM with a variable aperture providing similar resolution to full-size floor model systems.
The SNE-4500M goes beyond the performance of traditional tabletop SEM’s and is capable of similar functionality of lower end full-size SEM systems. Having more features than any other Tabletop SEM offers– the SNE-4500M is simply the most advanced compact SEM in its price range.
Advanced options available:
EDS Elemental Analysis – Backscatter detector (BSE) – Cooling Stage – Anti-Vibration table
Imaging Performance
RESOLUTION
5NM
MAGNIFICATION (LIVE)
100,000x
MULTI DETECTORS
SE (BSE option)
BEAM ENERGY
1-30 kV
Capture images with surface and topographic details
SE (Secondary Electron) Imaging
Capture images with surface and topographic details
BSE (Back-Scattered Electron) Imaging – optional
Capture images with material composition information (Atomic Weight Contrast imaging)
Convenience and Ease of Use
STAGE SYSTEM
X,Y,Z,R,T (5-axis) – manual
-
Beam Shift:150μm
AUTO SETTING
Start (Filament Saturation)
Focus / Stigmator
Brightness / Contrast
VIEWING MODES
Secondary Electron (SE)
Backscatter Electron (BSE) – optional
Dual View SE/BSE Multi Display
Specimen positioning is achieved via movement of the manual 5-axis stage. No other tabletop SEM in this class offers this capability. A wide variety of sample holders are available to accommodate any type of sample. The software offers the novice user a simple and clean interface free of clutter while the more advanced user can easily access features allowing further control of the microscope functions. With the intuitive software, users are able to view and save either SE and BSE images or as a composite image combining both SE+BSE as shown below (with optional BSE detector installed). This composite image provides a great tool for investigative analysis by offering both topographical (SE) and composition (BSE) information in one single image.
In addition, the software allows viewing both SE and BSE images in a side-by-side or Dual View mode.
Specifications for SNE-4500M
| ELECTRON BEAM SYSTEM | |
|---|---|
| RESOLUTION | 5nm (30kv, SE Image) 10nm (30kv, BSE Image) |
| ACCELERATING VOLTAGE | 1~30kV (1/5/10/15/20/30) |
| APERTURES | Variable - 30 / 50 / 50 / 100 micron Variable e-Beam Spot Size |
| DETECTOR | Secondary Electron Image(SE) Backscattered Electron Image(BSE) - optional 4 Quadrant BSE - full on/off control |
| ELECTRON GUN | Pre-centered Tungsten Filament Cartridge |
| IMAGING FEATURES | |
|---|---|
| AUTOMATIC FUNCTIONS | Auto Start Auto Focus Auto Stigmator Auto Contrast & Brightness |
| MAGNIFICATION (LIVE) | 20X~100,000X |
| MAGNIFICATION (SAVED) | > 500,000X (theoretical - see explanation in FAQ) |
| IMAGE CAPTURE SIZES | 5120 x 3840 2560 x 1920 1280 x 960 640 x 480 320 x 240 |
| IMAGE FORMATS | BMP, JPEG, PNG, TIFF |
| IMAGE ANNOTATION | 2-Point Length Multi-Point Length Angle Measurement Diameter Measurement Area Measurements Arrow/Rectangle Marking Text Annotations |
| VACUUM SYSTEM | |
|---|---|
| VACUUM MODES | High & Low Vacuum - standard Low Vacuum (Charge Reduction) - optional |
| ROUGHING VACUUM PUMP | Rotary Vane Pump (standard) |
| HIGH VACUUM PUMP | Pfeiffer HiPace Turbo Molecular Pump |
| DIMENSIONS | |
|---|---|
| MAIN UNIT | 390(W) x 380(D) x 560(H)mm, 88kg |
| CONTROLLER UNIT | 390(W) x 325(D) x 560(H)mm, 37kg |
| STAGE SYSTEM | |
|---|---|
| AUTOMATIC FUNCTIONS | 5-axis System (X, Y, R - Manual) X, Y-axis : ±40mm R-axis : 360° Z-axis : 0~35mm T-axis : 0~45˚ * Image Shift : ±150μm |
| MAXIMUM SAMPLE SIZE | 80mm in Diameter or XY 35mm in Height |