# NanoImages

> NanoImages is the exclusive US distributor of SEC Co. Ltd. desktop scanning electron microscopes (SEMs). We sell and lease the SNE-Alpha desktop SEM and complementary analytical instruments to research labs, universities, and industrial facilities across the United States. We are microscopists, not salespeople.

## Company Information

- Company: NanoImages
- Website: https://www.nanoimages.com
- Location: Lafayette, California, USA
- Phone: (925) 297-5668
- Email: info@nanoimages.com
- Founded: 2016
- Role: Exclusive US distributor for SEC Co. Ltd. desktop SEMs
- Note: NanoImages sells and leases equipment — we are NOT a service lab

## Primary Product: SNE-Alpha Desktop SEM

The SNE-Alpha is a high-performance desktop scanning electron microscope featuring:
- 5nm resolution at 30kV (best-in-class for desktop SEM)
- 20x to 250,000x magnification
- 1-30kV accelerating voltage (1kV steps)
- 90-second vacuum pump-down (50% faster than competitors)
- 5-axis motorized stage with <5um positioning accuracy
- SE (Secondary Electron) and BSE (Backscattered Electron) detectors standard
- High vacuum standard, low vacuum optional
- Dimensions: 300mm (W) x 465mm (D) x 600mm (H)
- 40% smaller footprint than previous generation desktop SEMs

## Accessories & Add-Ons

- [Bruker XFlash 630 EDS](https://www.nanoimages.com/products/bruker-xflash-eds/): Silicon drift detector for elemental analysis, Boron to Uranium
- [EBSD Detector](https://www.nanoimages.com/products/ebsd-eds-bruker/): Electron backscatter diffraction for crystal orientation mapping and phase identification
- [SEM-Raman Spectroscopy](https://www.nanoimages.com/products/raman/): Correlative SEM-Raman for molecular identification at the nanoscale
- [Cathodoluminescence (CL)](https://www.nanoimages.com/products/cathodoluminescence/): Optical property analysis of minerals, semiconductors, and materials
- [EBIC Analysis](https://www.nanoimages.com/products/ebic/): Electron beam induced current for semiconductor defect detection
- [MCM-100 Sputter Coater](https://www.nanoimages.com/products/sputter-coaters/): Gold, platinum, and carbon coating for non-conductive SEM samples
- [LinaSEC Series](https://www.nanoimages.com/products/linasec-series/): Additional desktop SEM models from SEC Co. Ltd.

## Applications (17 Industries)

- [Materials Science](https://www.nanoimages.com/applications/materials-science/): Failure analysis, fracture surfaces, grain structure, QC inspection
- [Life Sciences / Biology](https://www.nanoimages.com/applications/biology/): Cell imaging, tissue structure, biological characterization
- [Semiconductors](https://www.nanoimages.com/applications/semiconductors/): Wafer inspection, defect analysis, IC packaging
- [Forensics](https://www.nanoimages.com/applications/forensics/): Gunshot residue (GSR) analysis, fiber comparison, trace evidence
- [Geology / Geosciences](https://www.nanoimages.com/applications/geosciences/): Mineral identification, rock characterization
- [Nanomaterials](https://www.nanoimages.com/applications/nano-materials/): Nanoparticle characterization, thin films, quantum dots
- [Metallurgy](https://www.nanoimages.com/applications/metallurgy/): Alloy characterization, phase identification
- [Pharmaceuticals](https://www.nanoimages.com/applications/pharmaceutical/): Drug particle analysis, formulation QC
- [Aerospace](https://www.nanoimages.com/applications/aerospace/): Materials qualification, composite inspection, fatigue analysis
- [Healthcare](https://www.nanoimages.com/applications/healthcare/): Medical device analysis, implant characterization
- [Energy](https://www.nanoimages.com/applications/energy/): Battery materials, solar cells, fuel cells, catalysts
- [Chemistry](https://www.nanoimages.com/applications/chemistry/): Catalyst characterization, crystal structure analysis
- [Micro-Electronics](https://www.nanoimages.com/applications/micro-electronics/): Failure analysis, device characterization
- [Textiles & Fibers](https://www.nanoimages.com/applications/textiles-fibers/): Fiber structure, fabric characterization
- [Environmental](https://www.nanoimages.com/applications/environmental/): Particulate analysis, microplastics
- [Transportation](https://www.nanoimages.com/applications/transportation/): Wear analysis, coating inspection
- [Creative / Other](https://www.nanoimages.com/applications/other-cool-stuff/): Unique and diverse research applications

## Technology Resources

- [How SEM Works](https://www.nanoimages.com/technology/sem-technology/): Electron beam generation, sample interaction, signal detection, image formation
- [EDS Elemental Analysis](https://www.nanoimages.com/technology/eds-elemental-analysis/): Energy dispersive X-ray spectroscopy explained
- [EBSD Crystallography](https://www.nanoimages.com/technology/ebsd-crystallography/): Electron backscatter diffraction for grain analysis
- [Raman Spectroscopy](https://www.nanoimages.com/technology/raman-spectroscopy/): Molecular identification in SEM
- [Cathodoluminescence](https://www.nanoimages.com/technology/cathodoluminescence/): Optical properties analysis technique
- [EBIC Analysis](https://www.nanoimages.com/technology/ebic-analysis/): Electron beam induced current for semiconductor characterization
- [SEM Software](https://www.nanoimages.com/technology/sem-software/): Image acquisition, measurement, automation
- [SEM Tips & Best Practices](https://www.nanoimages.com/technology/sem-tips/): Sample preparation, imaging optimization, troubleshooting

## Company Pages

- [About NanoImages](https://www.nanoimages.com/company/about-us/): Exclusive US partner for SEC desktop SEMs since 2016
- [FAQs](https://www.nanoimages.com/company/faqs/): Common questions about purchasing, specifications, installation, and support
- [Lease Options](https://www.nanoimages.com/company/lease-options/): Flexible financing including lease-to-own and operating leases
- [Resources](https://www.nanoimages.com/company/resource-links/): External SEM societies, journals, educational materials

## Key Differentiators vs Competitors

### SNE-Alpha vs Phenom Desktop SEM
- Larger sample chamber
- Broader voltage range (1-30kV vs limited range)
- Lower operating cost (tungsten filament)
- More flexible sample mounting options
- Comparable 5nm resolution

### SNE-Alpha vs Floor-Model SEM (JEOL, Hitachi, Zeiss)
- Comparable resolution at lower price point
- 40% smaller footprint — no dedicated room required
- Faster pump-down (90 seconds)
- Lower maintenance costs

## Trusted By

Google, Meta, MIT, UC Berkeley, Purdue University, Texas A&M, Sandia National Labs, Oak Ridge National Lab, Canadian Nuclear Labs

## All Site Links

- [Homepage](https://www.nanoimages.com/)
- [Products](https://www.nanoimages.com/products/)
- [SNE-Alpha Specifications](https://www.nanoimages.com/products/sne-alpha/)
- [Applications](https://www.nanoimages.com/applications/)
- [Technology Overview](https://www.nanoimages.com/technology/)
- [Blog](https://www.nanoimages.com/blog/)
- [Contact / Request Demo](https://www.nanoimages.com/contact-us/)