Bruker XFlash® 630 EDS

//Bruker XFlash® 630 EDS
Bruker XFlash® 630 EDS 2018-01-26T11:17:49+00:00

Bruker XFlash® 630 EDS

The Bruker XFlash® 630 EDS with ESPRIT Compact software for simple or advanced Elemental Micro-Analysis

Adding EDS to your Tabletop SEM turns it into a very powerful analytical tool allowing a multitude of capabilities using advanced microanalysis features for elemental analysis. With the conical pole piece design of the SNE-3200 and SNE-4500, the EDS signal is collected at the optimal solid angle unlike other tabletop SEM designs that have a flat or near-flat construction for the pole piece (electron beam exit to the sample chamber).

The Bruker ESPRIT Compact software provides numerous capabilities for probing the samples composition, thickness and mapping as shown in the screenshots and explanations below.

Contact Us for further discussion about the merits of upgrading to the Bruker QUANTAX 200 software for more advanced capabilities such as:

  • Metal Inclusion Analysis (Steel Cleanliness – ASTM E1245/E2142/E45)
  • Mineral Phase Analysis, Mineral Liberation, Modal Mineralogy, Petrography
  • Gun Shot Residue – GSR (ASTM E1588)
  • General Particle Analysis for Cleanliness (ISO 16431/18413, IEST 1246D)
  • Wear Particle Analysis (ARP 598c, ASTM D7416, ASTM F311/F312, ISO 16232-8, ISO 4407)
  • Environmental Particles on Filters or Wipes (ASTM D6059, ASTM E2090, ISO 14966)
  • Particulate Contamination in Injections and Parenteral Infusions (USP 788)

The Bruker Quantax 200 software offers several dedicated modules and databases to assist with accomplishing these common types of analysis typically only possible with full-size SEM but now possible with TableTop SEM systems like the SNE-3200P or SNE4500P .

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Bruker ESPRIT EDS video demonstration

Video’s demonstrating operation of the Bruker ESPRIT software are available upon request – please Contact Us for access instructions

Hardware

Main Specifications of XFlash® 630 EDS H for Tabletop SEM

  1. High speed embedded type SDD Dectector (No LN2 required)
  2. Energy resolution: Less than 129 eV (at Mn Ka)
  3. Detector area: 30mm
  4. Element detection range: B(5) – Am(95)
  5. Maximum input count rate: > 150 kcps
  6. Software: Qualitative or Quantitative  Analysis
  7. Analysis Modes:  Point, Circle, Polygon, Line Scan, Mapping
Bruker XFlash EDS

Software

Point / Area Composition

  • The software has easy to use features for Composition Analysis at Points, Rectangles, Circles and Polygons
  • Fast and accurate qualitative or quantitative analysis with calibration capability is standard
  • Enhanced Deconvolution capabilities greatly improve quantified results

Mapping

  • Fast and high resolution mapping analysis with Bruker’s HyperMap
  • Mapping provides the function of analyzing the distribution of elements
  • Maps of individual element distribution can be broken out and saved separately
  • Spectra for each pixel are saved in a database for later recall and manipulation of point or line scan analysis
  • Various user settings for saving formats, colors, depth, filters, and more

Line Scan

  • Draw ROI (region of interest) with a line and analyze elements along that line
  • Easy to compare the elemental difference along ROI with line profile graph
  • Very useful for cross-section thickness analysis of multi-layer samples including the mixing zone
  • Various user settings for saving formats, colors, line scan width, filters and more

Reporting

  • A variety of reporting formats are provided that can be edited as desired
  • One-click saving of reports in Word or PDF
Bruker ESPRIT report generation
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